N-type doping of low-pressure chemical vapor deposition grown β-Ga<sub>2</sub>O<sub>3</sub> thin films using solid-source germanium

نویسندگان

چکیده

We report on the growth and characterization of Ge-doped \b{eta}-Ga2O3 thin films using a solid germanium source. were grown low-pressure chemical vapor deposition (LPCVD) reactor with either an oxygen or gallium delivery tube. Films 6 degree offcut sapphire (010) substrates rates between 0.5 - 22 {\mu}m/hr. By controlling pressure, wide range Hall carrier concentrations 10^17 10^19 cm-3 achieved. Low-temperature data revealed difference in donor incorporation depending configuration. At low rates, occupied single energy level 8 10 meV. higher doping predominantly results deeper at 85 This work shows effect design regime kinetics impurity incorporation. Studying is important for high-power electronic devices.

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ژورنال

عنوان ژورنال: Journal of vacuum science & technology

سال: 2021

ISSN: ['2327-9877', '0734-211X']

DOI: https://doi.org/10.1116/6.0001004